Measuring apparatus, on-chip instrumentation device and measuring method
US-12181278-B2 · Dec 31, 2024 · US
US8993967B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8993967-B2 |
| Application number | US-201113583675-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 1, 2011 |
| Priority date | Mar 31, 2010 |
| Publication date | Mar 31, 2015 |
| Grant date | Mar 31, 2015 |
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Probe light pulses output from a light source are input to an optical effect unit after the beam diameter is changed by a beam diameter changing optical system, the pulse front is tilted by a pulse front tilting unit, and the beam diameter is adjusted by a beam diameter adjusting optical system. To the optical effect unit, probe light pulses output from the beam diameter adjusting optical system are input, and an electromagnetic wave being an object to be detected is also input. Optical characteristics of the optical effect unit change due to propagation of the electromagnetic wave, and probe light pulses affected by the change in optical characteristics are output from the optical effect unit. The probe light pulses output from the optical effect unit are detected by a photodetector.
Opening claim text (preview).
The invention claimed is: 1. An electromagnetic wave detection device comprising: a light source which outputs probe light pulses; a beam diameter changing optical system which changes a beam diameter of the probe light pulses output from the light source; a pulse front tilting unit which tilts a pulse front of the probe light pulses output from the beam diameter changing optical system; a beam diameter adjusting optical system which adjusts a beam diameter of the probe ligh…
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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