Analyzing target analytes in a sample using mass spectroscopy

US8993958B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-8993958-B2
Application numberUS-201313895738-A
CountryUS
Kind codeB2
Filing dateMay 16, 2013
Priority dateMay 17, 2012
Publication dateMar 31, 2015
Grant dateMar 31, 2015

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Abstract

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A method for determining an amount of an analyte in a sample by mass spectrometry can include the steps of (i) ionizing an analyte from the sample and a deuterated analog of the analyte, to produce an analyte ion and a deuterated analog ion, where the deuterated analog undergoes fragmentation and deuterium scattering during mass spectrometry; (ii) measuring an analyte ion signal and a deuterated analog ion signal by mass spectrometry, where the deuterated analog ion signal is measured using a mass transition resulting from fragmentation and deuterium scattering; and (iii) determining an amount of analyte in the sample using the analyte ion signal and the deuterated analog ion signal. Corresponding kits can include instructions for carrying out the method, together with a deuterated analog of the analyte selected to undergo fragmentation and deuterium scattering during mass spectrometry and exhibit a mass transition resulting from fragmentation and deuterium scattering.

First claim

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The invention claimed is: 1. A method for determining an amount of an analyte in a sample by mass spectrometry, the method comprising: ionizing an analyte from the sample and a deuterated analog of the analyte to produce an analyte ion and a deuterated analog ion, wherein the deuterated analog undergoes fragmentation and deuterium scattering during mass spectrometry; selecting a mass transition resulting from fragmentation and deuterium scattering of the deuterated analog; mea…

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What does patent US8993958B2 cover?
A method for determining an amount of an analyte in a sample by mass spectrometry can include the steps of (i) ionizing an analyte from the sample and a deuterated analog of the analyte, to produce an analyte ion and a deuterated analog ion, where the deuterated analog undergoes fragmentation and deuterium scattering during mass spectrometry; (ii) measuring an analyte ion signal and a deuterate…
Who is the assignee on this patent?
Eastwood Martin, Micromass Ltd
What technology area does this patent fall under?
Primary CPC classification H01J49/0036. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Mar 31 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).