Photoresist layer outgassing prevention
US-2024282577-A1 · Aug 22, 2024 · US
US8993437B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8993437-B2 |
| Application number | US-201113282491-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 27, 2011 |
| Priority date | Oct 27, 2011 |
| Publication date | Mar 31, 2015 |
| Grant date | Mar 31, 2015 |
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One or more embodiments relate to a method of making a semiconductor structure, comprising: forming a patterned metallic layer over a semiconductor substrate; forming a second layer over the patterned metallic layer; and etching the substrate.
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What is claimed is: 1. A method of making a semiconductor structure, comprising: forming a patterned metallic layer over a semiconductor substrate; after forming the patterned metallic layer, coating said patterned metallic layer with a coating layer; etching said semiconductor substrate; and separating said substrate into a plurality of individual pieces. 2. The method of claim 1 , further including forming a barrier layer over said substrate before f…
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