Evaluation pattern, method for manufacturing semiconductor device, and semiconductor wafer

US8993354B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-8993354-B2
Application numberUS-201313841087-A
CountryUS
Kind codeB2
Filing dateMar 15, 2013
Priority dateSep 14, 2012
Publication dateMar 31, 2015
Grant dateMar 31, 2015

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

According to one embodiment, a method for manufacturing a semiconductor device is disclosed. The method includes heating a resistor pattern by scanning the resistor pattern with a first beam. The resistor pattern includes resistors, and a connection structure connecting the resistors in series. The resistors is arranged in matrix of two or more rows and two or more columns. The method includes further heating the resistor pattern by scanning the resistor pattern with a second beam having a different scan direction as that of the first beam.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for manufacturing a semiconductor device in a semiconductor wafer, the semiconductor device comprising a resistor pattern including a plurality of resistors provided in the semiconductor wafer and arranged in matrix of at least two rows and at least two columns, and a connection structure configured to connect the plurality of resistors in series, wherein the plurality of resistors includes a plurality of first resistors provided in a chip of the sem…

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What does patent US8993354B2 cover?
According to one embodiment, a method for manufacturing a semiconductor device is disclosed. The method includes heating a resistor pattern by scanning the resistor pattern with a first beam. The resistor pattern includes resistors, and a connection structure connecting the resistors in series. The resistors is arranged in matrix of two or more rows and two or more columns. The method includes …
Who is the assignee on this patent?
Toshiba Kk
What technology area does this patent fall under?
Primary CPC classification H10D1/47. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Mar 31 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).