Holding device, method of determining attraction abnormality in holding device, lithography apparatus, and method of manufacturing article
US-2024393682-A1 · Nov 28, 2024 · US
US8992789B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8992789-B2 |
| Application number | US-201313780769-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 28, 2013 |
| Priority date | Mar 16, 2012 |
| Publication date | Mar 31, 2015 |
| Grant date | Mar 31, 2015 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
According to one embodiment, a method is disclosed for manufacturing a mold. The method can include forming a second major surface receded from a first major surface by irradiating a portion of the first major surface with a charged beam to etch a base material having the first major surface. The method can include forming a mask pattern on the first major surface and the second major surface. In addition, the method can include forming a first pattern on the first major surface and a second pattern on the second major surface by etching the base material through the mask pattern.
Opening claim text (preview).
What is claimed is: 1. A method for manufacturing a mold, comprising: forming a second major surface receded from a first major surface by irradiating a portion of the first major surface with a charged beam to etch a base material having the first major surface, an upper part of another portion of the first major surface being shielded by a mask spaced from the first major surface while irradiating the portion of the first major surface; forming a mask pattern on the first majo…
Operations & Transport · mapped topic
Physics · mapped topic
Physics · mapped topic
Operations & Transport · mapped topic
Physics · mapped topic
Related publications grouped by family.
Free tools are coming soon. Tell us what you want to track and we'll notify you.
Answers are generated from the same data shown on this page.