Method and device for measuring basis weight and moisture content amount

Patent metadata

Field	Value
Publication number	US-8991240-B2
Application number	US-201013574856-A
Country	US
Kind code	B2
Filing date	Sep 21, 2010
Priority date	Jan 28, 2010
Publication date	Mar 31, 2015
Grant date	Mar 31, 2015

Abstract

A resonance frequency shift amount Δf and a peak level change amount ΔP are measured using a microwave resonator, V 1 and V 2 are obtained based on V 1 =(Δf·∈″2/Kf−ΔP·∈′2/Kp)/(∈′1·∈″2−∈″1·∈′2), and V 2 =(Δf·∈″1/Kf−ΔP·∈′1/Kp)/(∈″1·∈′2−∈′1·∈″2), and an absolute dry basis weight and a moisture amount are obtained based on absolute dry basis weight=β·V 1 , and moisture amount=γ·V 2 . For the constants Kf, Kp, ∈′1, ∈′2, ∈″1 and ∈″2, the constants ∈′1, ∈′2, ∈″1 and ∈″2 are determined so that the variance values of Kf and Kp are smaller than a predetermined value.

First claim

The invention claimed is:

1. A method of measuring basis weight and moisture amount for calculating a basis weight and a moisture amount of a sample constituted by a paper sheet using a microwave resonator, the method comprising the steps S 1 to S 6 of;
(Step S 1 )
obtaining a resonance frequency and a resonance peak level of the microwave resonator in a case without a sample;
(Step S 2 )
obtaining a resonance frequency and a resonance peak level of the microwave resonator…

Assignees

• Nagata Shinichi
• Sawamoto Hidetada
• Kurosawa Masahiro
• Oji Holdings Corp

Inventors

• Nagata Shinichi
• Sawamoto Hidetada
• Kurosawa Masahiro

Classifications

• G01N33/346

  Physics · mapped topic

• G01N22/04 Primary

  Physics · mapped topic