Non-linearity determination of positioning scanner of measurement tool

US8990961B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-8990961-B2
Application numberUS-201113217579-A
CountryUS
Kind codeB2
Filing dateAug 25, 2011
Priority dateJan 14, 2008
Publication dateMar 24, 2015
Grant dateMar 24, 2015

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  2. Abstract

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  5. First independent claim

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Abstract

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Determination of non-linearity of a positioning scanner of a measurement tool is disclosed. In one embodiment, a method may include providing a probe of a measurement tool coupled to a positioning scanner; scanning a surface of a first sample with the surface at a first angle relative to the probe to attain a first profile; scanning the surface of the first sample with the surface at a second angle relative to the probe that is different than the first angle to attain a second profile; repeating the scannings to attain a plurality of first profiles and a plurality of second profiles; and determining a non-linearity of the positioning scanner using the different scanning angles to cancel out measurements corresponding to imperfections due to the surface of the sample. The non-linearity may be used to calibrate the positioning scanner.

First claim

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What is claimed is: 1. A system comprising: a measurement tool including a probe coupled to a positioning scanner; a fixture for holding a sample for scanning a surface of the sample with the surface at a first angle relative to the probe to attain a plurality of first profiles, wherein the first angle is substantially 90° relative to the probe, and scanning the surface of the sample with the surface at a second angle relative to the probe that is different than the first angle…

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What does patent US8990961B2 cover?
Determination of non-linearity of a positioning scanner of a measurement tool is disclosed. In one embodiment, a method may include providing a probe of a measurement tool coupled to a positioning scanner; scanning a surface of a first sample with the surface at a first angle relative to the probe to attain a first profile; scanning the surface of the first sample with the surface at a second a…
Who is the assignee on this patent?
Banke Jr George W, Robert James M, Strocchia-Rivera Carlos, and 1 more
What technology area does this patent fall under?
Primary CPC classification G01B21/042. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Mar 24 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).