Selective cuts to remove predicted interconnect bulging regions
US-2024419882-A1 · Dec 19, 2024 · US
US8990744B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8990744-B2 |
| Application number | US-201313863740-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 16, 2013 |
| Priority date | Apr 16, 2013 |
| Publication date | Mar 24, 2015 |
| Grant date | Mar 24, 2015 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
The capacitance or inductance of electrical circuits is adjusted by measuring inductance or capacitance values of passive components fabricated on a first substrate, storing individual associations between the passive components and the respective measured values of the passive components, and determining electrical connections for the passive components based on the stored individual associations between the passive components and the respective measured values of the passive components. A corresponding system includes a tester operable to measure inductance or capacitance values of the passive components fabricated on the first substrate, a storage system operable to store the individual associations between the passive components and the respective measured values of the passive components, and a processing circuit operable to determine the electrical connections for the passive components based on the stored individual associations between the passive components and the respective measured values of the passive components.
Opening claim text (preview).
What is claimed is: 1. A method of adjusting the capacitance or inductance of electrical circuits, the method comprising: measuring inductance or capacitance values of passive components fabricated on a first substrate to yield measured values of the passive components; storing individual associations between the passive components and the measured values of the passive components, each of the individual associations linking or associating one of the passive components with the…
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Related publications grouped by family.
Free tools are coming soon. Tell us what you want to track and we'll notify you.
Answers are generated from the same data shown on this page.