Memory performance evaluation using address mapping information
US-2024394164-A1 · Nov 28, 2024 · US
US8990480B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8990480-B2 |
| Application number | US-201213586219-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 15, 2012 |
| Priority date | Mar 15, 2012 |
| Publication date | Mar 24, 2015 |
| Grant date | Mar 24, 2015 |
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According an embodiment, a semiconductor memory device includes a semiconductor memory chip to store plural pieces of data that are written and read in units of a page and are erased in units of a block including plural pages; a discarding unit to discard, after the data is written in the semiconductor memory chip with a logic address being designated, at least a portion of valid data among the plural pieces of data; a compaction unit to write the valid data excluding the discarded data in a second block among the valid data stored in a first block and erase the first block; and a controller to output, in response to a request for reading the discarded data, a response indicating that the data is unable to be read. When all the valid data included in a block are discarded, the discarding unit erases the block.
Opening claim text (preview).
What is claimed is: 1. A semiconductor memory device comprising: a semiconductor memory chip configured to store therein a plurality of pieces of data, the semiconductor memory chip being a chip in which data is written and from which data is read in units of a page that is a storage area having a predetermined size, and from which data is erased in units of a block including a plurality of pages; a discarding unit configured to, after a piece of the plurality of pieces of the d…
Physics · mapped topic
Physics · mapped topic
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