Apparatus and electronic devices including transistors comprising two-dimensional materials
US-2024339543-A1 · Oct 10, 2024 · US
US8987115B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8987115-B2 |
| Application number | US-200813059830-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 21, 2008 |
| Priority date | Aug 21, 2008 |
| Publication date | Mar 24, 2015 |
| Grant date | Mar 24, 2015 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
Methods of preparing a thin crystalline silicon film for transfer and devices utilizing a transferred crystalline silicon film are disclosed. The methods include preparing a silicon growth substrate which has an interface defining substance associated with an exterior surface. The methods further include depositing an epitaxial layer of silicon on the silicon growth substrate at the surface and separating the epitaxial layer from the substrate substantially along the plane or other surface defined by the interface defining substance. The epitaxial layer may be utilized as a thin film of crystalline silicon in any type of semiconductor device which requires a crystalline silicon layer. In use, the epitaxial transfer layer may be associated with a secondary substrate.
Opening claim text (preview).
What is claimed is: 1. A method of preparing a crystalline silicon film comprising: providing a non-porous, non-ion-implanted silicon growth substrate; associating an interface defining substance which is not silicon with an exterior surface of the silicon growth substrate; depositing at a low temperature an epitaxial layer of silicon on the exterior surface of the silicon growth substrate, wherein the low temperature is less than or equal to about 550° C.; separating the ep…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Related publications grouped by family.
Free tools are coming soon. Tell us what you want to track and we'll notify you.
Answers are generated from the same data shown on this page.