Methods of forming semiconductor devices
US-2024387699-A1 · Nov 21, 2024 · US
US8980756B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8980756-B2 |
| Application number | US-83044907-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 30, 2007 |
| Priority date | Jul 30, 2007 |
| Publication date | Mar 17, 2015 |
| Grant date | Mar 17, 2015 |
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Embodiments of a method for device fabrication by reverse pitch reduction flow include forming a first pattern of features above a substrate and forming a second pattern of pitch-multiplied spacers subsequent to forming the first pattern of features. In embodiments of the invention the first pattern of features may be formed by photolithography and the second pattern of pitch-multiplied spacers may be formed by pitch multiplication. Other methods for device fabrication are provided.
Opening claim text (preview).
What is claimed is: 1. A method for device fabrication, comprising: forming a first mask over a semiconductor substrate; photolithographically forming a first pattern of features over the first mask, the features of the first pattern of features having a first width; forming a second pattern of features over the first mask using spacers formed by pitch multiplication subsequent to photolithographically forming the first pattern or features, features of the second pattern of fe…
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