Apparatus and methods for forming phase change layer and method of manufacturing phase change memory device

Patent metadata

Field	Value
Publication number	US-8980679-B2
Application number	US-55089709-A
Country	US
Kind code	B2
Filing date	Aug 31, 2009
Priority date	Sep 3, 2008
Publication date	Mar 17, 2015
Grant date	Mar 17, 2015

Abstract

Provided are apparatus and methods for forming phase change layers, and methods of manufacturing a phase change memory device. A source material is supplied to a reaction chamber, and purges from the chamber. A pressure of the chamber is varied according to the supply of the source material and the purge of the source material.

First claim

What is claimed is:

1. A method of forming a phase change layer comprising:
sequentially supplying different metalloid source materials to a chamber to form the phase change layer; and
purging each metalloid source material from the chamber after provision thereof to the chamber,
wherein a pressure of the chamber is changed according to the supply of the metalloid source material and the purge of the metalloid source material,
wherein changing the pressure of the chamber comprises:
setting the chamber at a high pressure when supplying each of the metalloid source materials; and
setting the chamber at a low pressure when purging each of the metalloid source materials,

and wherein setting the chamber at a high pressure comprises setting the pressure of the chamber higher when supplying one of the metalloid source materials than when supplying the rest of the metalloid source materials.

2. The method of claim 1 , wherein sequentially supplying different metalloid source materials to the chamber comprises loading each source material on a carrier gas including at least one of an inert gas, nitrogen and combinations thereof to carry the source material to the chamber.

3. The method of claim 1 , further comprising supplying a reaction gas to the chamber, the reaction gas including any one of H 2 , NH 3 , N 2 H 4 , SiH 4 , B 2 H 6 , O 2 , O 3 , H 2 O and combinations thereof which react to the source materials to decompose the source materials.

4. The method of claim 1 , further comprising supplying a dopant gas including any one of Si, N, O, Bi, Sn, B and combinations thereof to the chamber.

5. A method of forming a phase change layer comprising:
supplying a source material to a chamber; and
purging the source material from the chamber,
wherein a pressure of the chamber is changed according to the supply of the source material and the purge of the source material, and wherein supplying a source material to the chamber comprises supplying a plurality of precursors to the chamber to form a phase change layer by depositing any one of Ga—Sb, In—Sb, In—Se, Sb—Te, Ge—Te, Ge—Sb, Ge—Sb—Te, Ge—Sb—In, Ge—Bi—Te, Ge—Te—As, Ge—Te—Sn, Ge—Se—Te, As—Sb—Te, In—Sb—Te, Ga—Se—Te, Sn—Sb—Te, Ga—Sb—Te, an element of 5A group-Sb—Te, an element of 6A group-Sb—Te, an element of 5A group-Sb—Se, an element of 6A group-Sb—Se, Ge—Te—Sn—Au, Ge—Te—Sn—Pd, Ge—Te—Sn—O, Ge—Sb—Te—S, (GeSn)—Sb—Te, Ge—Sb—(SeTe), In—Sb—Te—Ag, Ge—Sb—Te—O, Ge—Sb—Te—N, an element of 5A group-Sb—Te—Si, an element of 6A group-Sb—Te—Si, an element of 5A group-Sb—Se—Si, and an element of 6A group-Sb—Se—Si and wherein a pressure of the chamber is set higher when supplying one of the precursors than when supplying the rest of the precursors.

6. A method of forming a phase change layer comprising:
supplying a reaction gas to a chamber;
setting the chamber at a high pressure to supply Ge, Te and Sb source materials, wherein a pressure of the chamber is set higher when one of the source materials is supplied to the chamber to be hi her than a pressure of the chamber when the others of the source materials are supplied to the chamber;
performing a reaction of the source materials to the reaction gas to deposit Ge—Sb—Te; and
setting the chamber at a low pressure to purge the source materials.

7. The method of claim 6 , wherein depositing the Ge—Sb—Te comprises:
supplying the Ge source material to the chamber to deposit GeTe; and
supplying the Sb source material and Te source material to the chamber to deposit Sb 2 Te 3 , thereby forming the Ge—Sb—Te having a GeTe—Sb 2 Te 3 structure.

8. The method of claim 6 , further comprising supplying a dopant gas including any one of Si, N, O, Bi, Sn, B and combinations thereof to the chamber.

9. The method of claim 6 , further comprising setting the chamber in the range of a room temperature to 400 Celsius.

Assignees

• Im Dong-Hyun
• Bae Byoungjae
• Kim Dohyung
• Cho Sunglae
• Lee Jinil
• Seo Juhyung
• Park Hyeyoung
• Fujita Takehiko
• Samsung Electronics Co Ltd

Inventors

• Im Dong-Hyun
• Bae Byoungjae
• Kim Dohyung
• Cho Sunglae
• Lee Jinil
• Seo Juhyung
• Park Hyeyoung
• Fujita Takehiko

Classifications

• C23C16/45531 Primary

  specially adapted for making ternary or higher compositions · CPC title

• H01L45/143

  Electricity · mapped topic

• H01L45/148

  Electricity · mapped topic

• H01L45/1691

  Electricity · mapped topic

• H01L45/126

  Electricity · mapped topic