Scan, test, and control circuits coupled to IC surfaces contacts

Patent metadata

Field	Value
Publication number	US-8977919-B2
Application number	US-201313765260-A
Country	US
Kind code	B2
Filing date	Feb 12, 2013
Priority date	Feb 21, 2012
Publication date	Mar 10, 2015
Grant date	Mar 10, 2015

Abstract

A test control port (TCP) includes a state machine SM, an instruction register IR, data registers DRs, a gating circuit and a TDO MX. The SM inputs TCI signals and outputs control signals to the IR and to the DR. During instruction or data scans, the IR or DRs are enabled to input data from TDI and output data to the TDO MX and the top surface TDO signal. The bottom surface TCI inputs may be coupled to the top surface TCO signals via the gating circuit. The top surface TDI signal may be coupled to the bottom surface TDO signal via TDO MX. This allows concatenating or daisy-chaining the IR and DR of a TCP of a lower die with an IR and DR of a TCP of a die stacked on top of the lower die.

First claim

The invention claimed is:

1. An integrated circuit die comprising:
A. a bottom surface including Parallel Test Input (PTI) contact points, a Test Data input (TDI) contact point, Test Control Input (TCI) contact points, a Test Data Output (TDO) contact point, and Parallel Test Input/Output (PTIO) contact points;
B. a top surface including PTO contact points, a TDO contact point, Test Control Output (TCO) contact points, a TDI contact point, and PTIO contact points;
C. a Test Co…

Assignees

• Texas Instruments Inc

Inventors

• Whetsel Lee D

Classifications

• G01R31/318594

  Physics · mapped topic

• H01J37/3171

  Electricity · mapped topic

• G01R31/2607 Primary

  Physics · mapped topic

• G01R31/3177 Primary

  Physics · mapped topic

• H01J2237/30472

  Electricity · mapped topic