Method and apparatus for managing recommendation models
US-9218605-B2 · Dec 22, 2015 · US
Defect classification apparatus
US8977580B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8977580-B2 |
| Application number | US-201113703536-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 8, 2011 |
| Priority date | Jun 14, 2010 |
| Publication date | Mar 10, 2015 |
| Grant date | Mar 10, 2015 |
How to read this patent
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
- Title
What the patent document calls the invention.
- Abstract
A short plain-language summary of the technical disclosure.
- Assignees and inventors
Who owns or filed the patent and who is credited as inventor.
- Key dates
Filing, priority, publication, and grant dates set the timeline.
- First independent claim
The legal scope of protection — read this for what is actually claimed.
- CPC / IPC classifications
Technology tags used to group this patent with similar filings.
- Citations and related patents
Prior art links and similar publications in this corpus.
Abstract
Official abstract text for this publication.
The present invention has its objective to provide a defect classification apparatus which suppresses over-fitting and accurately classify the defect type of a defect. A defect classification apparatus is provided in which a data point indicating feature information of a defect to be classified having an unknown defect type is mapped to a point in a mapping space having a dimensional number higher than the number of features constituting the feature information, and the defect type of the defect to be classified is classified based on in which of two regions of defect type, which are formed by separating the mapping space by a decision boundary, the mapped point is located, wherein a discriminant function indicating the decision boundary is determined by adopting a weight which minimizes the sum of the classification error, which corresponds to the accuracy in classifying a training defect dataset, and a regularization term, which has a positive correlation with the dimensional number of the decision boundary, as the weight for each feature constituting the discriminant function.
First claim
Opening claim text (preview).
The invention claimed is: 1. A defect classification apparatus in which a data point indicating feature information whose components include a plurality of features indicating attributes of a defect to be classified having an unknown defect type is mapped to a point in a mapping space which has a dimensional number higher than the number of the features constituting the feature information, and determination is made as to which of two regions of defect type, which are formed by sep…
Assignees
Inventors
Classifications
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Patent family
Related publications grouped by family.
External sources
Next steps
Free tools are coming soon. Tell us what you want to track and we'll notify you.
Frequently asked questions
Answers are generated from the same data shown on this page.
- What does patent US8977580B2 cover?
- The present invention has its objective to provide a defect classification apparatus which suppresses over-fitting and accurately classify the defect type of a defect. A defect classification apparatus is provided in which a data point indicating feature information of a defect to be classified having an unknown defect type is mapped to a point in a mapping space having a dimensional number hig…
- Who is the assignee on this patent?
- Anayama Kazunori, Yadoguchi Tetsuya, Suzuma Toshiyuki, and 5 more
- What technology area does this patent fall under?
- Primary CPC classification G06N99/005. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Mar 10 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).