Automated inspection system
US-2024420305-A1 · Dec 19, 2024 · US
US8977070B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8977070-B2 |
| Application number | US-201314025952-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 13, 2013 |
| Priority date | Sep 29, 2004 |
| Publication date | Mar 10, 2015 |
| Grant date | Mar 10, 2015 |
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Blotches may be identified and processed to reduce or eliminate the blotch. The blotch may be in just one of several separations and multiple separations may be used, for example, to identify the blotch. An implementation (i) compares a first component image of an image with a first component image of a reference image, (ii) compares a second component image of the image with a second component image of the reference image, and (iii) determines based on these comparisons whether the first component image of the image includes a blotch. Multiple image separations also, or alternatively, may be used, for example, to modify the blotch, as well as to evaluate whether a modification is beneficial.
Opening claim text (preview).
What is claimed is: 1. A method comprising: accessing component images of a target image; analyzing the accessed component images; based on the analysis of the accessed component images, identifying, in a first component image of the target image, a portion of the first component image that corresponds to a blotch that is absent from at least one other of the accessed component images; identifying a region of the first component image located adjacent to the portion of the f…
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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