Image processing apparatus and 3D model generation method
US-12148211-B2 · Nov 19, 2024 · US
System, method and computer program product for detection of defects within inspection images
US8977035B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8977035-B2 |
| Application number | US-201213517520-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 13, 2012 |
| Priority date | Jun 13, 2012 |
| Publication date | Mar 10, 2015 |
| Grant date | Mar 10, 2015 |
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Abstract
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An analysis system for detection of defects within an inspection image of an inspected object, the inspection image comprising a plurality of pixels, the system including: a computerized segmentation module configured to segmentize the inspection image based on multiple anchor locations and on a mask which defines multiple mask-segments, by assigning each part out of multiple parts of the inspection image to a respective image-segment selected out of a multiple image segments, wherein the multiple image segments correspond to at least one mask-segment of said multiple mask-segments; and a defect detection processor configured to determine a presence of a defect in the inspection image based on the segmentation at least by assessing each pixel out of a plurality of pixels of the inspection image.
First claim
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What is claimed is: 1. An analysis system for detection of defects within an inspection image of an inspected object, the inspection image comprising multiple image parts, the system comprising: a computerized anchor processing module configured to obtain multiple anchor locations with respect to the inspection image; a computerized segmentation module operatively coupled to the computerized anchor processing module, configured to segmentize the inspection image, the segmentizin…
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- What does patent US8977035B2 cover?
- An analysis system for detection of defects within an inspection image of an inspected object, the inspection image comprising a plurality of pixels, the system including: a computerized segmentation module configured to segmentize the inspection image based on multiple anchor locations and on a mask which defines multiple mask-segments, by assigning each part out of multiple parts of the inspe…
- Who is the assignee on this patent?
- Dalla-Torre Michele, Shabat Gil, Dafni Adi, and 2 more
- What technology area does this patent fall under?
- Primary CPC classification G06T1/00. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Mar 10 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).