Device for measuring three dimensional shape

Patent metadata

Field	Value
Publication number	US-8976231-B2
Application number	US-201213561739-A
Country	US
Kind code	B2
Filing date	Jul 30, 2012
Priority date	Dec 15, 2011
Publication date	Mar 10, 2015
Grant date	Mar 10, 2015

Abstract

A device for measuring three dimensional shape includes a first irradiation unit, a first grating control unit, a second irradiation unit, a second grating control unit, an imaging unit, and an image processing unit. After performance of a first imaging operation as imaging processing of a single operation among a multiplicity of imaging operations performed by irradiation of said first light pattern of multiply varied phases, a second imaging operation is performed as imaging processing of a single operation among a multiplicity of imaging operations performed by irradiation of said second light pattern of multiply varied phases. After completion of the first imaging operation and the second imaging operation, shifting or switching operation of the first grating and the second grating is performed simultaneously.

First claim

What is claimed is:

1. A device for measuring three dimensional shape, the device comprising:
a first irradiation unit having a first light source for generation of a certain light, and a first grating for transforming light from said first light source into a first light pattern having a stripe-like light intensity distribution, so that the first irradiation unit is capable of irradiating said first light pattern from a first position upon an object to be measured;
a first grat…

Assignees

• Ishigaki Hiroyuki
• Ckd Corp

Inventors

• Ishigaki Hiroyuki

Classifications

• G01B11/2513

  Physics · mapped topic

• G01B11/2509 Primary

  Physics · mapped topic

• G06T2207/30152

  Physics · mapped topic

• G06T7/521

  Physics · mapped topic

• G06T2207/10152

  Physics · mapped topic