Metal gates for semiconductor devices and method thereof
US-2024429281-A1 · Dec 26, 2024 · US
US8975705B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8975705-B2 |
| Application number | US-201313893560-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 14, 2013 |
| Priority date | May 21, 2012 |
| Publication date | Mar 10, 2015 |
| Grant date | Mar 10, 2015 |
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A semiconductor device includes a first planar silicon layer, first and second pillar-shaped silicon layers, a first gate insulating film, a first gate electrode, a second gate insulating film, a second gate electrode, a first gate line connected to the first and second gate electrodes, a first n-type diffusion layer, a second n-type diffusion layer, a first p-type diffusion layer, and a second p-type diffusion layer. A center line extending along the first gate line is offset by a first predetermined amount from a line connecting a center of the first pillar-shaped silicon layer and a center of the second pillar-shaped silicon layer.
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The invention claimed is: 1. A semiconductor device, comprising: a first planar silicon layer formed on a substrate; first and second pillar-shaped silicon layers formed on the first planar silicon layer; a first gate insulating film formed around the first pillar-shaped silicon layer; a first gate electrode formed around the first gate insulating film; a second gate insulating film formed around the second pillar-shaped silicon layer; a second gate electrode formed arou…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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