Method of manufacturing a memory device using fine patterning techniques

US8975178B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-8975178-B2
Application numberUS-201213602841-A
CountryUS
Kind codeB2
Filing dateSep 4, 2012
Priority dateDec 27, 2011
Publication dateMar 10, 2015
Grant dateMar 10, 2015

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  2. Abstract

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  5. First independent claim

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Abstract

Official abstract text for this publication.

According to one embodiment, a method of manufacturing a device, includes forming a first core including a line portion extending between first and second regions and having a first width and a fringe having a dimension larger than the first width, forming a mask on the fringe and on a first sidewall on the first core, removing the first core so that a remaining portion having a dimension larger than the first width is formed below the mask, forming a second sidewall on a pattern corresponding the first sidewall and the remaining portion, the second sidewall having a second width less than the first width and facing a first interval less than the first width in the first region and facing a second interval larger than the first interval in the second region.

First claim

Opening claim text (preview).

What is claimed is: 1. A method of manufacturing a semiconductor device, comprising: forming a first layer to be processed on a first region and a second region of a semiconductor substrate; forming a first core material above the first layer, the first core material including a line portion extending in a first direction from the first region toward the second region and having a first line width in a second direction perpendicular to the first direction and a fringe connected…

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What does patent US8975178B2 cover?
According to one embodiment, a method of manufacturing a device, includes forming a first core including a line portion extending between first and second regions and having a first width and a fringe having a dimension larger than the first width, forming a mask on the fringe and on a first sidewall on the first core, removing the first core so that a remaining portion having a dimension large…
Who is the assignee on this patent?
Kikutani Keisuke, Nagashima Satoshi, Mukai Hidefumi, and 3 more
What technology area does this patent fall under?
Primary CPC classification H10P76/4085. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Mar 10 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).