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Methods and apparatus for testing electronic devices under specified radio-frequency voltage and current stress

US8971874B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-8971874-B2
Application numberUS-201313873048-A
CountryUS
Kind codeB2
Filing dateApr 29, 2013
Priority dateApr 8, 2013
Publication dateMar 3, 2015
Grant dateMar 3, 2015

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Test systems for characterizing devices under test (DUTs) are provided. A test system for testing a DUT in a shunt configuration may include a signal generator and a matching network that is coupled between the signal generator and the DUT and that is optimized to apply desired voltage/current stress to the DUT with reduced source power. The matching network may be configured to provide matching and desired stress levels at two or more frequency bands. In another suitable embodiment, a test system for testing a DUT in a series configuration may include a signal generator, an input matching network coupled between the DUT and a first terminal of the DUT, and an output matching network coupled between the DUT and a second terminal of the DUT. The input and output matching network may be optimized to apply desired voltage/current stress to the DUT with reduced source power.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for using a test system to test a device under test, comprising: with a signal generator, outputting radio-frequency test signals in a given frequency band to the device under test; and with matching network circuitry interposed between the signal generator and the device under test, applying a first predetermined amount of stress to the device under test in the given frequency band, wherein stress levels in frequency bands other than the given fr…

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Frequently asked questions

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What does patent US8971874B2 cover?
Test systems for characterizing devices under test (DUTs) are provided. A test system for testing a DUT in a shunt configuration may include a signal generator and a matching network that is coupled between the signal generator and the DUT and that is optimized to apply desired voltage/current stress to the DUT with reduced source power. The matching network may be configured to provide matchin…
Who is the assignee on this patent?
Apple Inc
What technology area does this patent fall under?
Primary CPC classification H04W24/06. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Mar 03 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).