Reducing Defects in Patterning Processes
US-2015357196-A1 · Dec 10, 2015 · US
US8969948B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8969948-B2 |
| Application number | US-201313852988-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 28, 2013 |
| Priority date | Mar 28, 2013 |
| Publication date | Mar 3, 2015 |
| Grant date | Mar 3, 2015 |
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Official abstract text for this publication.
A non-volatile memory device and a method for forming the non-volatile memory device are disclosed. During fabrication of the memory device, a tungsten salicide is utilized as an etch-stop layer in place of a conventionally used aluminum oxide to form channel pillars having a high aspect ratio. Use of the tungsten salicide is useful for eliminating an undesired etch-stop recess and an undesired floating gate that is formed when an Al oxide etch-stop layer is conventionally used.
Opening claim text (preview).
The invention claimed is: 1. A memory device, comprising: a channel comprising a first end and a second end, the first end of the channel being coupled to a bit line and the second end of the channel being coupled to a source; a select gate formed at the second end of the channel to selectively control conduction between the bit line and the channel, the select gate comprising a layer of tungsten salicide; at least one non-volatile memory cell formed along a length of the chan…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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