Apparatus and electronic devices including transistors comprising two-dimensional materials
US-2024339543-A1 · Oct 10, 2024 · US
US8969877B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8969877-B2 |
| Application number | US-201414148766-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 7, 2014 |
| Priority date | Sep 7, 2009 |
| Publication date | Mar 3, 2015 |
| Grant date | Mar 3, 2015 |
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A semiconductor device includes a semiconductor layer made of first conductivity type SiC; a second conductivity type well region formed on the semiconductor layer and having a channel region; a first conductivity type source region formed on the well region and including a first region adjacent to the well region and a second region adjacent to the first region; a gate insulating film formed on the semiconductor layer and having a first portion that contacts the first region; a second portion that contacts the well region and that has a thickness that is the same as that of the first portion; and a third portion that contacts the second region and that has a thickness that is greater than that of the first portion; and a gate electrode formed on the gate insulating film and opposed to the channel region where a channel is formed through the gate insulating film.
Opening claim text (preview).
The invention claimed is: 1. A semiconductor device, comprising: a semiconductor layer made of first conductivity type SiC; a well region that is a second conductivity type well region formed on a surface layer portion of the semiconductor layer and that has a channel region defined therein; a source region that is a first conductivity type source region formed on a surface layer portion of the well region and that includes a first region defined adjacent to the well region an…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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