Terahertz wave measurement device and method

Patent metadata

Field	Value
Publication number	US-8969805-B2
Application number	US-201313857249-A
Country	US
Kind code	B2
Filing date	Apr 5, 2013
Priority date	Oct 9, 2012
Publication date	Mar 3, 2015
Grant date	Mar 3, 2015

Abstract

The base plate is transmissive to terahertz waves, and a sample is disposed at the base plate. In the conductive periodic structure, plural transmission portions that transmit terahertz waves are arrayed with a predetermined period. The conductive periodic structure is disposed apart from a position at which the sample is disposed. The waveguide includes a total reflection surface provided at a boundary face with the conductive periodic structure. The total reflection surface totally reflects incident terahertz waves, and the waveguide guides incident terahertz waves toward the total reflection surface. The magnitudes of one or more of a distance between the position at which the sample is disposed and the conductive periodic structure, a property of the base plate, and the predetermined period are set such that a dip showing a characteristic absorption is formed in a predetermined frequency region of a spectrum of terahertz waves.

First claim

What is claimed is:

1. A terahertz wave measurement device comprising:
a base plate at which a sample is to be disposed, the base plate being transmissive to terahertz waves;
a conductive periodic structure in which a plurality of transmission portions that transmit terahertz waves are arrayed with a predetermined period, at least a surface of the conductive periodic structure being constituted with a conductive material, and the conductive periodic structure being disposed apart from a position at which the sample is disposed; and
a waveguide including a total reflection surface provided at a boundary face with the conductive periodic structure, the total reflection surface totally reflecting incident terahertz waves, and the waveguide guiding incident terahertz waves in a direction toward the total reflection surface,
wherein the magnitude of at least one of a distance between the position at which the sample is disposed and the conductive periodic structure, a property of the base plate, or the predetermined period is set such that terahertz waves emitted from the waveguide by total reflection at the total reflection surface show a characteristic absorption in a predetermined frequency region.

2. The terahertz wave measurement device according to claim 1 , wherein the conductive periodic structure is disposed at the side of a face of the base plate that is opposite to a face thereof at which the sample is disposed.

3. The terahertz wave measurement device according to claim 1 , wherein the base plate and the conductive periodic structure are disposed in area contact.

4. The terahertz wave measurement device according to claim 1 , wherein at least one of the base plate and the conductive periodic structure, or the waveguide and the conductive periodic structure is integrally structured.

5. The terahertz wave measurement device according to claim 1 , wherein the conductive periodic structure is sandwiched between the base plate and the waveguide, pressure is applied, and the base plate and the conductive periodic structure, and the conductive periodic structure and the waveguide are respectively put into area contact.

6. The terahertz wave measurement device according to claim 1 , wherein the base plate is structured as a micro-TAS including a channel in which the sample is disposed.

7. The terahertz wave measurement device according to claim 1 , wherein the conductive periodic structure includes a wire grid structure or a metal mesh structure.

8. The terahertz wave measurement device according to claim 1 , wherein the waveguide includes a prism.

9. The terahertz wave measurement device according to claim 1 , wherein the base plate includes glass or plastic.

10. A terahertz wave measurement method comprising:
measuring a reference spectrum using the terahertz wave measurement device according to claim 1 , the reference spectrum including at least one of an amplitude spectrum or a phase spectrum of terahertz waves relating to a reference sample that includes a binder that specifically binds with a measurement target substance;
measuring a target spectrum using the terahertz wave measurement device, the target spectrum including at least one of an amplitude spectrum or a phase spectrum of terahertz waves relating to one of a target sample in which the measurement target substance is added to the reference sample, or a target sample in which a content of the measurement target substance is unknown; and
performing at least one of detection, identification or characteristic analysis of the measurement target substance on the basis of at least one of a frequency region showing a characteristic absorption or a signal strength at this frequency region in each of the reference spectrum and the target spectrum.

Assignees

• Hasebe Takayuki
• Tabata Hitoshi
• Kitamura Shigeru
• Univ Tokyo
• Arkray Inc

Inventors

• Hasebe Takayuki
• Tabata Hitoshi
• Kitamura Shigeru

Classifications

• G01N21/01

  Arrangements or apparatus for facilitating the optical investigation · CPC title

• G01N21/552

  Attenuated total reflection · CPC title

• G01N21/59 Primary

  Transmissivity (G01N21/25 takes precedence) · CPC title

• G01N21/3581 Primary

  using far infrared light; using Terahertz radiation · CPC title