Photoelectric conversion material
US-9224896-B2 · Dec 29, 2015 · US
US8969181B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8969181-B2 |
| Application number | US-201213440616-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 5, 2012 |
| Priority date | Apr 11, 2011 |
| Publication date | Mar 3, 2015 |
| Grant date | Mar 3, 2015 |
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Oxygen, silicon, germanium, carbon, or nitrogen is selectively implanted into a workpiece. The workpiece is annealed to incorporate the ions into the workpiece. A compound semiconductor is then formed on the workpiece. For example, gallium nitride may be formed on a silicon, silicon carbide, or sapphire workpiece. The width of the implanted regions can be configured to compensate for any shrinkage during annealing.
Opening claim text (preview).
What is claimed is: 1. A method of workpiece processing comprising: selectively implanting ions into a plurality of implanted regions in a workpiece, wherein said ions comprise oxygen, silicon, germanium, carbon, or nitrogen; annealing said workpiece such that said ions are incorporated into said implanted regions; and forming a compound semiconductor on said workpiece, wherein said compound semiconductor grows over said implanted regions. 2. The method o…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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Electricity · mapped topic
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