Electronic device, method, and computer program product
US-2015379251-A1 · Dec 31, 2015 · US
Pattern detection based on fractal analysis
US8965136B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8965136-B2 |
| Application number | US-55968306-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 14, 2006 |
| Priority date | Nov 14, 2006 |
| Publication date | Feb 24, 2015 |
| Grant date | Feb 24, 2015 |
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Abstract
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Various systems, methods, and programs embodied in computer-readable mediums are provided for the detection of patterns. In one embodiment, a pattern detection method is provided that comprises the step of performing a fractal analysis of a pattern to generate a plurality of scaling parameters from a fractal associated with the pattern in a computer system. In addition, the method further comprises the step of detecting a degree of organization in the pattern by examining a degree of equality among the scaling parameters of the fractal in the computer system.
First claim
Opening claim text (preview).
Therefore, having thus described the invention, at least the following is claimed: 1. A system for organized pattern detection, comprising: a processor circuit having a processor and a memory; a detection system stored in the memory and executable by the processor, the detection system comprising: logic that performs a fractal analysis of a pattern to generate a plurality of scaling parameters from a fractal associated with the pattern; and logic that detects a degree of org…
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Physics · mapped topic
- G06K9/00087Primary
Physics · mapped topic
Physics · mapped topic
- G06V40/1365Primary
Physics · mapped topic
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Frequently asked questions
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- What does patent US8965136B2 cover?
- Various systems, methods, and programs embodied in computer-readable mediums are provided for the detection of patterns. In one embodiment, a pattern detection method is provided that comprises the step of performing a fractal analysis of a pattern to generate a plurality of scaling parameters from a fractal associated with the pattern in a computer system. In addition, the method further compr…
- Who is the assignee on this patent?
- Jaffe Charles, Stiller Alfred H, Univ West Virginia
- What technology area does this patent fall under?
- Primary CPC classification G06K9/00087. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Feb 24 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).