Methods and systems for measuring properties with ultrasound
US-2016363561-A1 · Dec 15, 2016 · US
Ultrasonic modeling for inspection of composite irregularities
US8965100B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8965100-B2 |
| Application number | US-201213355100-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 20, 2012 |
| Priority date | Jan 20, 2012 |
| Publication date | Feb 24, 2015 |
| Grant date | Feb 24, 2015 |
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Abstract
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A first simulated inspection is conducted to provide a first waveform data set associated with the at least one irregularity parameter. The first simulated inspection is conducted using a first evaluation setting. A first image is produced based on the first waveform set, and it is determined whether a quality of the first image satisfies a predetermined threshold.
First claim
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What is claimed is: 1. A method for use in inspecting a composite structure, said method comprising: generating a virtual model of the composite structure; defining at least one irregularity parameter; conducting a first simulated inspection of the virtual model with a modeling module configured to transmit at least one simulated wave towards the virtual model to provide a first non-transitory waveform data set associated with the at least one irregularity parameter, wherein t…
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- G01N29/4472Primary
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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- What does patent US8965100B2 cover?
- A first simulated inspection is conducted to provide a first waveform data set associated with the at least one irregularity parameter. The first simulated inspection is conducted using a first evaluation setting. A first image is produced based on the first waveform set, and it is determined whether a quality of the first image satisfies a predetermined threshold.
- Who is the assignee on this patent?
- Lin John Z, Tat Hong, Bossi Richard H, and 1 more
- What technology area does this patent fall under?
- Primary CPC classification G01N29/4472. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Feb 24 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).