For test (DFT) read speed through transition detector in built-in self-test (BIST) sort

Patent metadata

Field	Value
Publication number	US-8964484-B2
Application number	US-201213729153-A
Country	US
Kind code	B2
Filing date	Dec 28, 2012
Priority date	Dec 28, 2012
Publication date	Feb 24, 2015
Grant date	Feb 24, 2015

Abstract

A memory operate in a normal mode of operation or a testing mode of operation. In the testing mode of operation, the memory can measure various benchmarks of performance, such as read speed. The memory can perform an asynchronous read operation to read a word of electronic data that corresponds to an address or a page read operation in which multiple asynchronous read operations are performed to read multiple words of electronic data, also referred to as a page of electronic data, that correspond to multiple addresses. The memory can measure a time required, referred to as read speed, to read the word of electronic data or the multiple words of electronic data from the memory. In the normal mode of operation, the memory can perform the asynchronous read operation, the page read operation, an asynchronous write operation in which a word of electronic data is stored into the memory that correspond to the address, or a page write operation in which a page electronic data is stored into the memory that correspond to the multiple addresses.

First claim

What is claimed is:

1. A memory with integrated capabilities to measure read speed, comprising:
a read speed counter configured to begin a counting process from a first state upon toggling of a first control line from a first logical value to a second logical value;
a memory array configured to read a plurality of bits corresponding to an address upon the toggling of the first control line from the first logical value to the second logical value;
an output latch configured to…

Assignees

• Spansion Llc

Inventors

• Ong Mee-Choo
• Ch Ng Sheau-Yang
• Teoh Boon-Weng
• Lau Sie Wei Henry
• Beh Jih Hong
• Ong Wei-Kent

Classifications

• G11C29/44

  Physics · mapped topic

• G11C29/56012 Primary

  Physics · mapped topic

• G11C29/50012

  Physics · mapped topic

• G11C29/1201

  Physics · mapped topic