Solid-state microscope for selectively imaging a sample

Patent metadata

Field	Value
Publication number	US-8964020-B2
Application number	US-10392008-A
Country	US
Kind code	B2
Filing date	Apr 16, 2008
Priority date	Apr 25, 2007
Publication date	Feb 24, 2015
Grant date	Feb 24, 2015

Abstract

Exemplary embodiments provide solid-state microscope (SSM) devices and methods for processing and using the SSM devices. The solid-state microscope devices can include a light emitter array having a plurality of light emitters with each light emitter individually addressable. During operation, each light emitter can be biased in one of three operating states including an emit state, a detect state, and an off state. The light emitter can include an LED (light emitting diode) including, but not limited to, a nanowire based LED or a planar LED to provide various desired image resolutions for the SSM devices. In an exemplary embodiment, for near-field microscopy, the resolution of the SSM microscope can be essentially defined by the pitch p, i.e., center-to-center spacing between two adjacent light emitters, of the light emitter array.

First claim

What is claimed is:

1. A solid-state microscope for imaging an object comprising:
a semiconductor substrate;
a first light emitter disposed on the semiconductor substrate, were the first light emitter is biased in an emit operating state at a first time period and biased in a detect state at a second time period, the second time period being subsequent to the first time period;
a second light emitter disposed on the substrate and adjacent to the first light emitter, wherein th…

Assignees

• Hersee Stephen D
• Stc Unm

Inventors

• Hersee Stephen D

Classifications

• H10H29/142

  Electricity · mapped topic

• H10H20/818

  Electricity · mapped topic

• H10H20/032

  Electricity · mapped topic

• H10H20/825

  Electricity · mapped topic

• H10H20/824

  Electricity · mapped topic