Probe apparatus
US-12000862-B2 · Jun 4, 2024 · US
Inspection device for glass substrate
US8963571B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8963571-B2 |
| Application number | US-201113375715-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 7, 2011 |
| Priority date | Aug 24, 2011 |
| Publication date | Feb 24, 2015 |
| Grant date | Feb 24, 2015 |
How to read this patent
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
- Title
What the patent document calls the invention.
- Abstract
A short plain-language summary of the technical disclosure.
- Assignees and inventors
Who owns or filed the patent and who is credited as inventor.
- Key dates
Filing, priority, publication, and grant dates set the timeline.
- First independent claim
The legal scope of protection — read this for what is actually claimed.
- CPC / IPC classifications
Technology tags used to group this patent with similar filings.
- Citations and related patents
Prior art links and similar publications in this corpus.
Abstract
Official abstract text for this publication.
Disclosed is an inspection device for a glass substrate, comprising at least one probe, a holder, a stretch controller and a control circuit. The probe is installed on the stretch controller, the stretch controller is employed to stretch the probe out of the holder as an electrical signal is received; and to retract the probe backward in the holder as the electrical signal stops. The present invention promotes the inspection efficiency for the glass substrate.
First claim
Opening claim text (preview).
What is claimed is: 1. An inspection device for a glass substrate, comprising at least one probe and a holder, characterized in that the inspection device for the glass substrate further comprises a stretch controller and a control circuit, and one end portion of the probe is installed on the stretch controller, the other end portion of the probe is inserted through the holder, the stretch controller is employed to stretch the probe out of the holder as an electrical signal is rec…
Assignees
Inventors
Classifications
- G01R1/06705Primary
Physics · mapped topic
- G09G3/006Primary
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Patent family
Related publications grouped by family.
External sources
Next steps
Free tools are coming soon. Tell us what you want to track and we'll notify you.
Frequently asked questions
Answers are generated from the same data shown on this page.
- What does patent US8963571B2 cover?
- Disclosed is an inspection device for a glass substrate, comprising at least one probe, a holder, a stretch controller and a control circuit. The probe is installed on the stretch controller, the stretch controller is employed to stretch the probe out of the holder as an electrical signal is received; and to retract the probe backward in the holder as the electrical signal stops. The present in…
- Who is the assignee on this patent?
- Cheng Wen-Da, Shenzhen China Star Optoelect
- What technology area does this patent fall under?
- Primary CPC classification G01R1/06705. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Feb 24 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).