Avalanche photodiode
US-2024204127-A1 · Jun 20, 2024 · US
US8962978B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8962978-B2 |
| Application number | US-95963110-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 3, 2010 |
| Priority date | Jul 28, 2005 |
| Publication date | Feb 24, 2015 |
| Grant date | Feb 24, 2015 |
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A semiconductor structure is described, including a semiconductor substrate and a semiconductor layer disposed on the semiconductor substrate. The semiconductor layer is both compositionally graded and structurally graded. Specifically, the semiconductor layer is compositionally graded through its thickness from substantially intrinsic at the interface with the substrate to substantially doped at an opposite surface. Further, the semiconductor layer is structurally graded through its thickness from substantially crystalline at the interface with the substrate to substantially amorphous at the opposite surface. Related methods are also described.
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What is claimed: 1. A semiconductor structure, comprising: a doped crystalline semiconductor substrate; and a semiconductor layer disposed on the doped crystalline semiconductor substrate, the semiconductor layer having a structurally graded region through a first depth from a substantially crystalline state at a lower portion of the structurally graded region to a substantially amorphous state at an upper portion of the structurally graded region, wherein the lower portion of the structurally graded region is disposed in direct contact with the doped crystalline semiconductor substrate, and wherein the lower portion of the structurally graded region comprises crystals such that the width of the crystals is substantially wider than the thickness of the lower portion. 2. The semiconductor structure, as set forth in claim 1 , wherein the semiconductor layer further comprises a compositionally graded region through a second depth from a substantially intrinsic state at a lower portion of the compositionally graded region to a substantially doped state at an upper portion of the compositionally graded region. 3. The semiconductor structure, as set forth in claim 2 , wherein the structurally graded region and the compositionally graded region at least partially overlap. 4. A photovoltaic device, comprising a first electrode; a second electrode; and a semiconductor structure disposed between the first electrode and the second electrode, the semiconductor structure comprising: a doped crystalline semiconductor substrate; and a semiconductor layer disposed on the doped crystalline semiconductor substrate, the semiconductor layer having a structurally graded region through a first depth from a substantially crystalline state at a lower portion of the structurally graded region to a substantially amorphous state at an upper portion of the structurally graded region, wherein the lower portion of the structurally graded region is disposed in direct contact with the doped crystalline semiconductor substrate, and wherein the lower portion of the structurally graded region comprises crystals such that the width of the crystals is substantially wider than the thickness of the lower portion.
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