Capacitor and semiconductor device including the same
US-2024387608-A1 · Nov 21, 2024 · US
US8962347B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8962347-B2 |
| Application number | US-201113301396-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 21, 2011 |
| Priority date | Jan 19, 2011 |
| Publication date | Feb 24, 2015 |
| Grant date | Feb 24, 2015 |
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A ferroelectric capacitor formed above a semiconductor substrate includes a lower electrode, a dielectric film (ferroelectric film) having ferroelectric characteristics, and an upper electrode. The upper electrode includes a conductive oxide film made of a ferroelectric material to which conductivity is provided by adding a conductive material such as Ir, and the conductive oxide film is in contact with the dielectric film.
Opening claim text (preview).
What is claimed is: 1. A method of manufacturing a semiconductor device, the method comprising: forming a lower electrode film above a semiconductor substrate; forming a dielectric film made of a ferroelectric material on the lower electrode film by a sputtering method; subjecting the dielectric film to a crystallization treatment; and forming a conductive oxide film on the dielectric film, the conductive oxide film being made of a ferroelectric material to which conductivit…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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