Retrographic sensors
US-2024384983-A1 · Nov 21, 2024 · US
Extensometer for measuring high-temperature structural deformations by magnification
US8955231B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8955231-B2 |
| Application number | US-201113817130-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 28, 2011 |
| Priority date | Sep 28, 2011 |
| Publication date | Feb 17, 2015 |
| Grant date | Feb 17, 2015 |
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Abstract
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The present invention relates to an extensometer for measuring high-temperature structural deformations by magnification, the structure of the extensometer is that: two mounting block assemblies are mounted at the planar ends of two extension bars respectively, the top ends of the extension bars are connected tightly with the surface of a test piece, two connecting pieces are mounted at the inner sides of the two mounting block assemblies respectively, a deformation magnifying mechanism and a sensor bracket are mounted on the connecting pieces, a sensor is mounted on the sensor bracket, two connecting pieces are mounted on a same straight line, and the straight line is parallel to a straight line at which the top ends of the two extension bars are located, so as to ensure that the deformation of the test piece is delivered equally to the deformation magnifying mechanism on the connecting pieces. The present invention can measure local deformations of various metal and non-metallic structures online for a long time in real time at high temperatures, extend the deformation of the test piece at high temperatures outside of the high temperature region, and measure the deformations after they are magnified through a mechanical magnifying mechanism, thus the present invention has a very high linearity, resolution, and accuracy, meanwhile has a light structure and a small size, and is easy to install.
First claim
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We claim: 1. An extensometer for measuring high-temperature structural deformations by magnification, characterized in that the extensometer for measuring high-temperature structural deformations by magnification is consisted of a pair of extension bars ( 7 ), two mounting block assemblies ( 5 ), two connecting pieces ( 4 ), a deformation magnifying mechanism ( 6 ), a sensor ( 1 ) and a sensor bracket ( 3 ), the extension bar ( 7 ) is a round bar, one end of which is planar, the ot…
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- What does patent US8955231B2 cover?
- The present invention relates to an extensometer for measuring high-temperature structural deformations by magnification, the structure of the extensometer is that: two mounting block assemblies are mounted at the planar ends of two extension bars respectively, the top ends of the extension bars are connected tightly with the surface of a test piece, two connecting pieces are mounted at the inn…
- Who is the assignee on this patent?
- Tu Shandong, Jia Jiuhong, Hu Xiaoyin, and 2 more
- What technology area does this patent fall under?
- Primary CPC classification G01B5/20. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Feb 17 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).