Inspection method
US8949060B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8949060-B2 |
| Application number | US-201113295757-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 14, 2011 |
| Priority date | Nov 15, 2010 |
| Publication date | Feb 3, 2015 |
| Grant date | Feb 3, 2015 |
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Abstract
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In order to set an inspection area in an inspection apparatus for inspecting a board, a plurality of measurement areas are set on a board, and then reference data and measurement data of at least one adjacent measurement area that is adjacent to a target measurement area for inspecting a measurement target, among the measurement areas, are acquired. Thereafter, at least one feature object is extracted from the adjacent measurement area. Then, a distortion degree is acquired by comparing reference data and measurement data corresponding to the feature object with each other, and thereafter the distortion degree is compensated for, to set an inspection area in the target measurement area. Thus, a conversion relation between the reference data and the measurement data may be correctly acquired, and an inspection area, in which distortion is compensated for, may be correctly set.
First claim
Opening claim text (preview).
What is claimed is: 1. An inspection method comprising: setting a plurality of measurement areas on a board; acquiring reference data and measurement data of at least one adjacent measurement area that is adjacent to a target measurement area for inspecting a measurement target, among the measurement areas; extracting at least one feature object from the adjacent measurement area; acquiring a distortion degree by comparing reference data and measurement data corresponding to…
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Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
- G01N11/24Primary
Physics · mapped topic
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- What does patent US8949060B2 cover?
- In order to set an inspection area in an inspection apparatus for inspecting a board, a plurality of measurement areas are set on a board, and then reference data and measurement data of at least one adjacent measurement area that is adjacent to a target measurement area for inspecting a measurement target, among the measurement areas, are acquired. Thereafter, at least one feature object is ex…
- Who is the assignee on this patent?
- Hwang Bong-Ha, Koh Young Tech Inc
- What technology area does this patent fall under?
- Primary CPC classification G01N11/24. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Feb 03 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We do not list related publications for this record yet—either no in-corpus citations or no shared primary CPC matches in our current data slice.