Method for calibrating clinical chemistry instruments

US8949059B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-8949059-B2
Application numberUS-79829010-A
CountryUS
Kind codeB2
Filing dateApr 1, 2010
Priority dateApr 1, 2009
Publication dateFeb 3, 2015
Grant dateFeb 3, 2015

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Abstract

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A method of deriving correction for instrument-to-instrument variations in the illumination band centroid wavelengths and wavelength band shapes of the optical systems of clinical chemistry instruments includes the steps of determining the centroid wavelength and wavelength band shape of a light source used in the optical system of a clinical chemistry instrument to provide a determined wavelength band shape and centroid wavelength, comparing the determined wavelength band shape and centroid wavelength with a known reflection density or absorbance wavelength spectrum of a specific type of chemical reagent test to provide a correction value, and calculating the correction value, which is to be used to modify a reflection density or absorbance measurement taken by the instrument of a reagent test of the a specific type of chemical reagent test.

First claim

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What is claimed is: 1. A method of calibrating an optical system of a clinical chemistry instrument, the optical system including at least one light source and a light detector, the at least one light source emitting light to illuminate an object, the illuminated object reflecting light, the light detector receiving light reflected by the object illuminated by the light from the at least one light source, the light detector providing a signal in response to light received by the li…

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What does patent US8949059B2 cover?
A method of deriving correction for instrument-to-instrument variations in the illumination band centroid wavelengths and wavelength band shapes of the optical systems of clinical chemistry instruments includes the steps of determining the centroid wavelength and wavelength band shape of a light source used in the optical system of a clinical chemistry instrument to provide a determined wavelen…
Who is the assignee on this patent?
Misener Garland Christian, Idexx Lab Inc
What technology area does this patent fall under?
Primary CPC classification G01N21/274. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Feb 03 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).