Gradient metal liner for interconnect structures
US-2024332075-A1 · Oct 3, 2024 · US
US8946077B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8946077-B2 |
| Application number | US-201414158223-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 17, 2014 |
| Priority date | Jan 22, 2013 |
| Publication date | Feb 3, 2015 |
| Grant date | Feb 3, 2015 |
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A method of manufacturing a semiconductor device includes forming a plurality of conductive lines separated from one another in a first direction via a slender hole and extending in a second direction perpendicular to the first direction, forming a first insulation layer filling the slender hole between the plurality of conductive lines, forming a plurality of first isolated holes separated from one another between the plurality of conductive lines in the first direction and the second direction by patterning the first insulation layer, forming a liner layer in the first isolated holes, filling a second insulation layer having an etching selectivity with respect to the first insulation layer, in the first isolated holes on the liner layer and forming a plurality of second isolated holes between the conductive lines by removing the first insulation layer using the etching selectivity between the second insulation layer and the first insulation layer.
Opening claim text (preview).
What is claimed is: 1. A method of manufacturing a semiconductor device, the method comprising: forming a plurality of conductive lines separated from one another in a first direction via a slender hole and extending in a second direction perpendicular to the first direction; forming a first insulation layer filling the slender hole between the plurality of conductive lines; forming a plurality of first isolated holes separated from one another between the plurality of conduct…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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