Resist composition and pattern forming process
US-2024377730-A1 · Nov 14, 2024 · US
US8945406B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8945406-B2 |
| Application number | US-201213604698-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 6, 2012 |
| Priority date | Sep 6, 2011 |
| Publication date | Feb 3, 2015 |
| Grant date | Feb 3, 2015 |
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A method for manufacturing a symbol on an exterior of an electronic device is provided. The method includes preparing a support layer, preparing a nanograting layer on the support layer, the nanograting layer including a first nanograting area corresponding to a preset symbol and a second nanograting area corresponding to an area other than the preset symbol, wherein each of the first nanograting area and the second nanograting area includes three-dimensional (3D) nanostructures and a pitch between the 3D nanostructures arranged in the first nanograting area is different from a pitch between the 3D nanostructures arranged in the second nanograting area.
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What is claimed is: 1. A method for manufacturing a symbol on an exterior of an electronic device, the method comprising: preparing a support layer; and preparing a nanograting layer on the support layer, the nanograting layer including a first nanograting area corresponding to a preset symbol and a second nanograting area corresponding to an area other than the preset symbol, wherein the first nanograting area includes three-dimensional (3D) nanostructures arranged a first pi…
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