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US-2024320079-A1 · Sep 26, 2024 · US
Method for metric ranking in invariant networks of distributed systems
US8943367B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8943367-B2 |
| Application number | US-201313738004-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 10, 2013 |
| Priority date | Jan 11, 2012 |
| Publication date | Jan 27, 2015 |
| Grant date | Jan 27, 2015 |
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Abstract
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A method for metric ranking in invariant networks includes, given an invariant network and a set of broken invariants, two ranking processes are used to determine and rank the anomaly scores of each monitoring metrics in large-scale systems. Operators can follow the rank to investigate the root-cause in problem investigation. In a first ranking process, given a node/metric, the method determines multiple scores by integrating information from immediate neighbors to decide the anomaly score for metric ranking. In a second ranking process, given a node/metric, an iteration process is used to recursively integrate the information from immediate neighbors at each round to determine its anomaly score for metric ranking.
First claim
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The invention claimed is: 1. A method for metric ranking in invariant networks, the method comprising: considering an invariant network and a set of broken invariants in said invariant network; under first process, given a node/metric of said invariant network, determining multiple scores by integrating information from immediate neighboring nodes of said node to decide an anomaly score of said node for metric ranking; and under a second process, given a node/metric of said in…
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Physics · mapped topic
- G06F11/079Primary
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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- What does patent US8943367B2 cover?
- A method for metric ranking in invariant networks includes, given an invariant network and a set of broken invariants, two ranking processes are used to determine and rank the anomaly scores of each monitoring metrics in large-scale systems. Operators can follow the rank to investigate the root-cause in problem investigation. In a first ranking process, given a node/metric, the method determine…
- Who is the assignee on this patent?
- Nec Lab America Inc
- What technology area does this patent fall under?
- Primary CPC classification G06F11/079. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Jan 27 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).