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Spectral characteristic measurement method and spectral characteristic measurement apparatus that corrects for stray light
US8941829B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8941829-B2 |
| Application number | US-201213397681-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 16, 2012 |
| Priority date | Mar 10, 2011 |
| Publication date | Jan 27, 2015 |
| Grant date | Jan 27, 2015 |
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Abstract
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A spectral characteristic measurement method for measuring spectral characteristics of measured light with higher accuracy is provided. The spectral characteristic measurement method includes causing an optical measurement instrument having detection sensitivity in a first wavelength range to receive light in a second wavelength range which is a part of the first wavelength range, obtaining characteristic information indicating a stray light component from a portion of a first spectrum detected by the optical measurement instrument, that corresponds to a range other than the second wavelength range, and obtaining a pattern indicating a stray light component generated in the optical measurement instrument by subjecting the characteristic information to extrapolation processing as far as the second wavelength range in the first wavelength range.
First claim
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What is claimed is: 1. A spectral characteristic measurement method, comprising: preparing an optical measurement instrument having detection sensitivity in a first wavelength range; arranging a filter that cuts off light having a wavelength range other than a second wavelength range, the second wavelength range is a part of the first was range; obtaining characteristic information indicating a stray light component from a portion of the first wavelength range of the filtered…
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Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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- What does patent US8941829B2 cover?
- A spectral characteristic measurement method for measuring spectral characteristics of measured light with higher accuracy is provided. The spectral characteristic measurement method includes causing an optical measurement instrument having detection sensitivity in a first wavelength range to receive light in a second wavelength range which is a part of the first wavelength range, obtaining cha…
- Who is the assignee on this patent?
- Sano Hiroyuki, Taguchi Kunikazu, Otsuka Denshi Kk
- What technology area does this patent fall under?
- Primary CPC classification G01J3/0291. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Jan 27 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).