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US-12182243-B2 · Dec 31, 2024 · US
Color-unevenness inspection apparatus and method
US8941730B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8941730-B2 |
| Application number | US-201113033417-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 23, 2011 |
| Priority date | Mar 3, 2010 |
| Publication date | Jan 27, 2015 |
| Grant date | Jan 27, 2015 |
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Abstract
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A color-unevenness inspection apparatus includes: an image pickup section picking up an image of an inspection target in a color-unevenness inspection; and an image generation section generating an uneven-color image by, in the picked-up image of the inspection target obtained by the image pickup section, calculating a chroma in each unit region and identifying an uneven-color region based on a magnitude of the calculated chroma. The color-unevenness inspection apparatus further includes: a calculation section calculating, for the uneven-color region in the uneven-color image, an evaluation parameter to be used in the color-unevenness inspection; and an inspection section performing the color-unevenness inspection based on the calculated evaluation parameter. The image generation section calculates the chroma, in each unit region of the picked-up image, while performing correction processing that reflects variations in color-unevenness visibility from color to color.
First claim
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What is claimed is: 1. A color-unevenness inspection apparatus comprising: an image pickup section to pick up an image of an inspection target in a color-unevenness inspection; an image generation section to generate an uneven-color image by, in the picked-up image of the inspection target obtained by the image pickup section, calculating a chroma in each unit region and identifying an uneven-color region based at least in part on a magnitude of the calculated chroma; a calcul…
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- What does patent US8941730B2 cover?
- A color-unevenness inspection apparatus includes: an image pickup section picking up an image of an inspection target in a color-unevenness inspection; and an image generation section generating an uneven-color image by, in the picked-up image of the inspection target obtained by the image pickup section, calculating a chroma in each unit region and identifying an uneven-color region based on a…
- Who is the assignee on this patent?
- Nagamine Kunihiko, Tomioka Satoshi, Sony Corp
- What technology area does this patent fall under?
- Primary CPC classification G06T7/00. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Jan 27 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).