Semiconductor device and processes for making same
US-2024290783-A1 · Aug 29, 2024 · US
US8940602B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8940602-B2 |
| Application number | US-201313860832-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 11, 2013 |
| Priority date | Apr 11, 2013 |
| Publication date | Jan 27, 2015 |
| Grant date | Jan 27, 2015 |
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A FinFET structure which includes a bulk semiconductor substrate; semiconductor fins extending from the bulk semiconductor substrate, each of the semiconductor fins having a top portion and a bottom portion such that the bottom portion of the semiconductor fins is doped and the top portion of the semiconductor fins is undoped; a portion of the bulk semiconductor substrate directly underneath the plurality of semiconductor fins being doped to form an n+ or p+ well; and an oxide formed between the bottom portions of the fins. Also disclosed is a method for forming a FinFET device.
Opening claim text (preview).
What is claimed is: 1. A method of forming a FinFET device comprising, in the following order: forming a plurality of semiconductor fins from a bulk semiconductor substrate; forming an oxide layer between each of the plurality of semiconductor fins, the oxide layer extending from the bulk semiconductor substrate only part way up a sidewall of each of the semiconductor fins to cover a bottom portion of each of the semiconductor fins, a top portion of the sidewall of each of the s…
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