System and method for laser-based auto-alignment
US-9221137-B2 · Dec 29, 2015 · US
Calibration artefact for calibrating an articulating probe head
US8939008B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8939008-B2 |
| Application number | US-201113137102-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 20, 2011 |
| Priority date | Sep 22, 2003 |
| Publication date | Jan 27, 2015 |
| Grant date | Jan 27, 2015 |
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Abstract
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A method of calibrating an articulating probe head comprising the steps of measuring an artifact of known dimensions with the workpiece sensing probe mounted on the articulating probe head, in which the articulating probe head is unlocked. An error functional map is generated corresponding to the difference between the measured and known dimensions of the artifact. Subsequent workpieces are measured with the articulating probe head unlocked and the corresponding correction applied. The true dimensions of the artifact may be determined by measuring it with a probe mounted on an articulating probe head in which the axes of the articulating probe head are locked. A mechanical lock is provided to lock the axes of the articulating probe head.
First claim
Opening claim text (preview).
What is claimed is: 1. A calibration artifact for calibrating an articulating probe head mounted on an arm of a coordinate positioning machine, the calibration artifact comprising: a base for supporting the calibration artifact on a surface of the coordinate positioning machine; and profiles of different dimensions that can be scanned by articulating the probe head relative to the arm of the coordinate positioning machine, wherein the profiles are operatively coupled to the ba…
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Physics · mapped topic
Physics · mapped topic
- G01B21/042Primary
Physics · mapped topic
Physics · mapped topic
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- What does patent US8939008B2 cover?
- A method of calibrating an articulating probe head comprising the steps of measuring an artifact of known dimensions with the workpiece sensing probe mounted on the articulating probe head, in which the articulating probe head is unlocked. An error functional map is generated corresponding to the difference between the measured and known dimensions of the artifact. Subsequent workpieces are mea…
- Who is the assignee on this patent?
- Mcmurtry David Roberts, Mcfarland Geoff, Nai Kenneth Cheng-Hoe, and 3 more
- What technology area does this patent fall under?
- Primary CPC classification G01B21/042. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Jan 27 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).