Techniques for retiring blocks of a memory system
US-2024363185-A1 · Oct 31, 2024 · US
US8937845B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8937845-B2 |
| Application number | US-201213665917-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 31, 2012 |
| Priority date | Oct 31, 2012 |
| Publication date | Jan 20, 2015 |
| Grant date | Jan 20, 2015 |
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A system for managing redundancy in a memory device includes memory arrays and associated periphery logic circuits, and redundant memory arrays and associated redundant periphery logic circuits. The memory arrays and a first set of logic circuits associated with the periphery logic circuits corresponding to the memory arrays are connected to the power supply by way of memory I/O switches. The redundant memory arrays and associated redundant periphery logic circuits are connected to the power supply by way of redundant I/O switches. The memory and redundant I/O switches are switched on/off based on an acknowledgement signal generated during a built-in-self-test (BIST) operation of the memory device.
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What is claimed is: 1. A system for managing redundancy in a memory device, wherein the memory device includes a first memory array and a first periphery logic circuit associated therewith, and at least one redundant memory array and a redundant periphery logic circuit associated therewith, wherein the first periphery logic circuit includes first and second logic circuits, and wherein the second logic circuit includes first and second sets of logic circuits, the system comprising:…
Physics · mapped topic
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