Semiconductor device
US-12057459-B2 · Aug 6, 2024 · US
US8937313B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8937313-B2 |
| Application number | US-201213477802-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 22, 2012 |
| Priority date | Jan 10, 2012 |
| Publication date | Jan 20, 2015 |
| Grant date | Jan 20, 2015 |
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A semiconductor device and a method of manufacturing the same are disclosed. In one embodiment, the semiconductor device includes a substrate, a first silicon nitride layer formed over the substrate, a first silicon oxide layer formed directly on the first silicon nitride layer and having a thickness of about 1000 Å or less, and a hydrogenated polycrystalline silicon layer formed directly on the first silicon oxide layer.
Opening claim text (preview).
What is claimed is: 1. A semiconductor device comprising: a substrate; a first buffer layer formed over the substrate, wherein the first buffer layer contains hydrogen; and an active layer formed on the first buffer layer and containing polycrystalline silicon and hydrogen, wherein the concentration of the hydrogen contained in the active layer is about 1 atomic percent (at. %) or more, wherein the device further comprises a second buffer layer formed between and contacting…
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