Holding device, method of determining attraction abnormality in holding device, lithography apparatus, and method of manufacturing article
US-2024393682-A1 · Nov 28, 2024 · US
US8937019B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8937019-B2 |
| Application number | US-201313855173-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 2, 2013 |
| Priority date | Apr 3, 2012 |
| Publication date | Jan 20, 2015 |
| Grant date | Jan 20, 2015 |
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Official abstract text for this publication.
Techniques for forming a three dimensional (3D) feature on a substrate are disclosed. In one exemplary embodiment, the technique may be realized as a method comprising: forming a resist structure on the substrate, the resist structure having a first resist portion with a first thickness, a second resist portion with a second thickness, and a third resist portion with a third thickness, where the first thickness may be less than the second thickness, and where the second thickness may be less than the third thickness; implanting charged particles into the substrate through the first and second resist portions and forming an implanted region in the substrate; and etching the substrate to form the 3D feature on the substrate.
Opening claim text (preview).
What is claimed is: 1. A method of forming a three dimensional (3D) feature on a substrate, the method comprising: forming a resist structure on the substrate, the resist structure having a first resist portion with a first thickness, a second resist portion with a second thickness, and a third resist portion with a third thickness, wherein the first thickness is less than the second thickness, and wherein the second thickness is less than the third thickness; implanting charged…
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