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US-12076981-B2 · Sep 3, 2024 · US
Image recording apparatus and recording defect inspection method for same
US8936342B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8936342-B2 |
| Application number | US-201313763496-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 8, 2013 |
| Priority date | Feb 10, 2012 |
| Publication date | Jan 20, 2015 |
| Grant date | Jan 20, 2015 |
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Abstract
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An aspect of a recording defect inspection method for an image recording apparatus includes: a recording step of sequentially recording test patterns of respective recording heads onto a recording medium, an image capturing step of capturing an image of a test pattern recorded on the recording medium by means of a scanner, an analysis step of analyzing the captured test pattern and detecting a recording defect of the recording head which has recorded the test pattern, an evaluation frequency setting step of setting an evaluation frequency for each of the recording heads on the basis of a recording defect occurrence frequency for each recording head, and a control step of setting a frequency of each of the recording heads in the test patterns to the set evaluation frequency.
First claim
Opening claim text (preview).
What is claimed is: 1. A recording defect inspection method for an image recording apparatus, comprising: a recording step of sequentially recording test patterns of respective recording heads onto a recording medium; an image capturing step of capturing an image of a test pattern recorded on the recording medium by means of a scanner; an analysis step of analyzing the captured test pattern and detecting a recording defect of the recording head which has recorded the test patt…
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Classifications
- B41J2/165Primary
Operations & Transport · mapped topic
- B41J29/393Primary
Operations & Transport · mapped topic
Operations & Transport · mapped topic
Operations & Transport · mapped topic
Operations & Transport · mapped topic
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Frequently asked questions
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- What does patent US8936342B2 cover?
- An aspect of a recording defect inspection method for an image recording apparatus includes: a recording step of sequentially recording test patterns of respective recording heads onto a recording medium, an image capturing step of capturing an image of a test pattern recorded on the recording medium by means of a scanner, an analysis step of analyzing the captured test pattern and detecting a …
- Who is the assignee on this patent?
- Fujifilm Corp
- What technology area does this patent fall under?
- Primary CPC classification B41J2/165. Mapped technology areas include Operations & Transport.
- When was this patent published?
- Publication date Tue Jan 20 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).