Selective cuts to remove predicted interconnect bulging regions
US-2024419882-A1 · Dec 19, 2024 · US
US8935643B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8935643-B2 |
| Application number | US-201113267874-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 6, 2011 |
| Priority date | Oct 6, 2011 |
| Publication date | Jan 13, 2015 |
| Grant date | Jan 13, 2015 |
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Disclosed are techniques for detecting hotspots using parameter matching. According to various implementations of the invention, devices in an electronic circuit design are classified into device groups based on their values for one or more device parameters, which can be derived from layout data describing the devices. Representative electrical information for each of the device groups is determined and used as a basis for hotspot detection.
Opening claim text (preview).
What is claimed is: 1. A method of hotspot determination, comprising: receiving layout data for a layout design; extracting, using a computer, a netlist from the layout design; classifying devices in the netlist into device groups based on values for one or more device parameters derived from the layout data, the one or more device parameters describing one or more physical parameters of the devices corresponding to electrical information for the devices in the device groups;…
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