Lithographic apparatus and device manufacturing method
US-9195153-B2 · Nov 24, 2015 · US
US8934081B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8934081-B2 |
| Application number | US-92997711-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 28, 2011 |
| Priority date | Feb 26, 2010 |
| Publication date | Jan 13, 2015 |
| Grant date | Jan 13, 2015 |
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An alignment method for the of patterning a work piece in a direct write machine, wherein a reference board provided with board reference features is used to coordinate calibration of a measurement station and a writing station against a common reference. An adjusted pattern is for writing on the work piece is calculated relative to the position of the reference board.
Opening claim text (preview).
The invention claimed is: 1. A method of patterning a layer of a workpiece in a write machine, the write machine including, a pattern writing station having a write machine coordinate system, and a measurement station having a measurement coordinate system, the measurement station being configured to measure objects on the workpiece associated with reference features of the workpiece, the workpiece being placed on a carrier stage, and the write machine being configured to move t…
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