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US-12169410-B2 · Dec 17, 2024 · US
System and method for remote measurement of optical focus
US8934005B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8934005-B2 |
| Application number | US-201214232016-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 3, 2012 |
| Priority date | Jul 14, 2011 |
| Publication date | Jan 13, 2015 |
| Grant date | Jan 13, 2015 |
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Abstract
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A system and method that measures an optical focus of a distant optical imaging system (EYE), in particular the ocular accommodation of a distant human subject. A luminous pattern of light (P 1 , A 1 ) is projected by a projector (P) in focus (A 2 ) at a known focal plane (FPL 1 ) in front of the distant optical imaging system (EYE), and an image of the reflection of the pattern (A 3 ) on a sensor surface of the distant optical imaging system (EYE), for instance the retina of an eye, is recorded by a camera (CAM) having an optical axis (AXCAM) coinciding at least partly with or situated close to the optical axis (AXP) of the projection device (P). The sharpness of the luminous pattern (A 3 ) reflected from the sensor surface (retina) is determined.
First claim
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The invention claimed is: 1. A measurement system for remote measurement of an optical focus of a distant optical imaging system, the distant optical imaging system comprising a lens and a sensor surface, wherein the measurement system comprises: a light projection device (P) for projecting a luminous pattern of light such that the pattern is in focus at a known focal plane (FPL 1 ) in front of the lens of the distant optical imaging system; a camera (CAM) having an optical axis…
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- What does patent US8934005B2 cover?
- A system and method that measures an optical focus of a distant optical imaging system (EYE), in particular the ocular accommodation of a distant human subject. A luminous pattern of light (P 1 , A 1 ) is projected by a projector (P) in focus (A 2 ) at a known focal plane (FPL 1 ) in front of the distant optical imaging system (EYE), and an image of the reflection of the pattern (A 3 ) on a sen…
- Who is the assignee on this patent?
- De Bruijn Frederik Jan, Vlutters Ruud, Schmeitz Harold Agnes Wilhelmus, and 2 more
- What technology area does this patent fall under?
- Primary CPC classification G06F3/013. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Jan 13 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).