Cantilever probe card device and cantilever probe module
US-2024385222-A1 · Nov 21, 2024 · US
Combined probe head for a vertical probe card and method for assembling and aligning the combined probe head thereof
US8933719B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8933719-B2 |
| Application number | US-201113189572-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 25, 2011 |
| Priority date | Jul 27, 2010 |
| Publication date | Jan 13, 2015 |
| Grant date | Jan 13, 2015 |
How to read this patent
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
- Title
What the patent document calls the invention.
- Abstract
A short plain-language summary of the technical disclosure.
- Assignees and inventors
Who owns or filed the patent and who is credited as inventor.
- Key dates
Filing, priority, publication, and grant dates set the timeline.
- First independent claim
The legal scope of protection — read this for what is actually claimed.
- CPC / IPC classifications
Technology tags used to group this patent with similar filings.
- Citations and related patents
Prior art links and similar publications in this corpus.
Abstract
Official abstract text for this publication.
A combined probe head being disposed in a space transformer of a vertical probe card is provided, in which the combined probe head is used for differentiating or segmenting a layout area of the probes in the vertical probe card. The combined probe head may include a locating plate and sub-probe heads. The locating plate may include fixed portions. Each sub-probe head may include corresponding sub-dies and probes inserted between the sub-dies, and each sub-probe head is assembled and fixed in the corresponding fixed portion. Therefore, the layout area of the probes in the vertical probe card can be respectively differentiated or segmented from the sub-probe heads in order to avoid mutual interference under repair process. In addition, a related method for assembling and aligning the above mentioned combined probe head is provided.
First claim
Opening claim text (preview).
What is claimed is: 1. A combined probe head, being disposed in a space transformer of a vertical probe card, the combined probe head comprises: a locating plate, comprising a plurality of fixed portions and a support beam structure, wherein the fixed portions are defined by the support beam structure; and a plurality of sub-probe heads, the sub-probe heads are disposed in horizontal alignment with each other, wherein each sub-probe head comprises: an upper sub-die, a lower su…
Assignees
Inventors
Classifications
Physics · mapped topic
- G01R1/07342Primary
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Patent family
Related publications grouped by family.
External sources
Next steps
Free tools are coming soon. Tell us what you want to track and we'll notify you.
Frequently asked questions
Answers are generated from the same data shown on this page.
- What does patent US8933719B2 cover?
- A combined probe head being disposed in a space transformer of a vertical probe card is provided, in which the combined probe head is used for differentiating or segmenting a layout area of the probes in the vertical probe card. The combined probe head may include a locating plate and sub-probe heads. The locating plate may include fixed portions. Each sub-probe head may include corresponding s…
- Who is the assignee on this patent?
- Huang Chao-Ching, Chen Wen-Chi, Chang Chiu-Chu, and 1 more
- What technology area does this patent fall under?
- Primary CPC classification G01R1/07342. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Jan 13 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).