Sample observation apparatus

Patent metadata

Field	Value
Publication number	US-8933418-B2
Application number	US-201213541174-A
Country	US
Kind code	B2
Filing date	Jul 3, 2012
Priority date	Jul 11, 2011
Publication date	Jan 13, 2015
Grant date	Jan 13, 2015

Abstract

A sample observation apparatus includes excitation light irradiation unit to irradiate sample with excitation light; excitation light modulator to modulate spatial intensity distribution of the excitation light on the sample; excitation light modulation control unit to control the excitation light modulator according to modulation control signal; photo detection unit to detect light emission from the sample and to generate a detection signal; image generation unit to generate image data of the sample according to the modulation control signal and the detection signal; modulation control signal generation unit to generate the modulation control signal such that Nyquist frequency of the image data will be larger than cut-off frequency in the spatial intensity distribution of the excitation light on the sample; and image processing unit to emphasize high-frequency component that exceeds the cut-off frequency included in the image data.

First claim

What is claimed is:

1. A sample observation apparatus comprising:
an excitation light irradiation unit to irradiate a sample with an excitation light;
an excitation light modulation unit to modulate a spatial intensity distribution of the excitation light on the sample;
an excitation light modulation control unit to control the excitation light modulation unit according to a modulation control signal;
a photo detection unit to detect light emission from the sample caused by…

Assignees

• Hayashi Shinichi
• Olympus Corp

Inventors

• Hayashi Shinichi

Classifications

• G01N21/6458 Primary

  Physics · mapped topic